Nano-Level Gear Inspection Goes Smaller
With the 175GMS nano, Gleason brings submicron-level inspection capabilities to smaller gears, helping ensure minimal noise, greater precision, and longer life
Complete inspection of gear surface finishes at the submicron level became a reality with the introduction of Gleason’s 300GMS nano, in 2022. The new system ushered in an exciting new era in gear inspection. For the first time, producers of EV transmission gears, and gears for other applications requiring very tight tolerances and low noise requirements, could quickly inspect surface finishes and perform extremely reliable noise analysis at submicron levels—benefits that were almost impossible to achieve just a few years ago.
Based on the success of the 300GMS nano platform, Gleason has expanded its nano series with the introduction of the 175GMS nano gear metrology system, for all types of gears as large as 175 mm in diameter and shaft-type gears up to 500 mm in length, with a module range of 0.4 (0.2 is optional) to 6.35 mm.
Now, based on the success of the 300GMS nano platform, Gleason has expanded its nano series with the introduction of the 175GMS nano gear metrology system. The 175GMS nano picks up where the very popular 175GMS leaves off. Like its predecessor, it’s designed for the complete inspection of all types of gears as large as 175 mm in diameter and shaft-type gears up to 500 mm in length, with a module range of 0.4 (0.2 is optional) to 6.35 mm. But it also delivers the additional nano capabilities first offered with the 300GMS nano. Users can now measure, at submicron level, gear pitch, tooth size, profile, and lead at high speed along with surface finishes with a skidless probe seamlessly integrated into an automated probe changer. The latest GAMA software platform also performs noise analysis with the Advanced Waviness Analysis software tool. The 175GMS nano gear metrology system is equipped with a high-precision SP25 3D scanning probe head, a wide range of styli, and an advanced mathematical analysis that supports roughness evaluations to DIN, ISO, ANSI, and other standards. It also offers 3D measurement and GD&T analysis rivaling those of a CMM.
Users can now measure, at submicron level, gear pitch, tooth size, profile, and lead at high speed along with surface finishes with a skidless probe that is seamlessly integrated into the automated probe changer.
Like all the metrology systems in the Gleason GMS series, the 175GMS nano seamlessly integrates into any user’s manufacturing ecosystem through Gleason’s latest GAMA 3.2 application with its best user-friendly interface supporting a dozen plus international languages. Fully compatible with Windows, it effortlessly integrates into server environments, opening avenues for enhanced SPC data evaluation and remote maintenance services via Gleason Connect, among others.